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Metrology, Inspection, and Process Control for Microlithography XIX Brand New!

Description: CTA-EB Complete in 3 volumes. Brand New in factory-sealed plastic. Proceedings of The International Society for Optical Engin.

Price: 125 USD

Location: Kutztown, Pennsylvania

End Time: 2025-01-20T15:45:21.000Z

Shipping Cost: 9.97 USD

Product Images

Metrology, Inspection, and Process Control for Microlithography XIX   Brand New!Metrology, Inspection, and Process Control for Microlithography XIX   Brand New!

Item Specifics

Restocking Fee: No

Return shipping will be paid by: Buyer

All returns accepted: Returns Accepted

Item must be returned within: 30 Days

Refund will be given as: Money Back

Publication Year: 2005

Format: Trade Paperback

Language: English

Book Title: Proceedings of SPIE

Author: Richard M. Silver

Publisher: International Society for Optical Engineering

Genre: Science

Topic: Optical Engineering

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